BAA Announcement Number FOA-AFRL-AFOSR-2021-0003

Topic Number (2): (AFOSR) Microelectronic Test Science Exploiting Latent Energy and Electromagnetic Radiation

CoMMAND aims: To meet the need for advanced metrology techniques with high spatial and temporal resolution and high sensitivity that probe all components of integrated circuits (ICs), including the elaborate network of metallic interconnects, this research program will develop new fundamental concepts in non- or minimally invasive testing and evaluation and will integrate them with the most advanced existing methods to enhance our ability to probe present and future micro-/nanoelectronics ICs.

PMs: Brett Pokines, Logan Mailloux, Richard Ott, Kenneth Goretta, Donald Dorsey, Christopher Bozada

AFOSR MURI Project Kick-Off meeting